Applications are welcome for a Postdoc in computational Electromagnetics for Soft X-ray Wafer Metrology at Eindhoven University of Technology (TU/e).
The position is embedded in the Electromagnetics (EM) group at TU/e. The EM group focuses on engineering the behavior of electromagnetic waves for a wide range of advanced applications, from designing antennas for applications ranging from 5G and satellite communication to radio-telescopes and from health applications like MRI-safety and hyperthermia treatment to (numerical) modeling for complex and high-tech systems. Their lab, the electromagnetic and multi-physics modeling and computation (EMPMC) lab within the research group researches innovative computational methods for electromagnetics and optics.
The overall goal in the LYNX project is to:
- Develop a very fast and extremely accurate wafer metrology technique to enable the next generations of semiconductor manufacturing.
- Control the production process of semiconductor manufacturing, a constant recalibration is required to ensure that components and connections are aligned with nanometer precision. and
- Develop metrology capabilities to monitor the production tolerances in a running production line.
Salary
- A gross monthly salary and benefits in accordance with the Collective Labor Agreement for Dutch Universities.
- Additionally, an annual holiday allowance of 8% of the yearly salary, plus a year-end allowance of 8.3% of the annual salary.
- A broad package of fringe benefits (including an excellent technical infrastructure, moving expenses, and savings schemes).
Job Requirements
The position, Postdoc in computational Electromagnetics for Soft X-ray Wafer Metrology seeks candidates with:
- A PhD degree (or an equivalent university degree) in Electrical Engineering, Physics, Mathematics or a related field with a clear experience in computational modeling.
- A passion for research with a real-life application.
- Experience with programming is a must.
- Experience with modern Fortran and Python and/or Matlab are helpful.
- Ability to work in a team.
- Experience with Linux is advantageous
- Proficient in spoken and written English.
Application Process
Applicants are welcome to submit a complete application by using the link below. The application should include a:
- Cover letter describing applicant motivation and qualifications for the position.
- Curriculum vitae, including a list of publications and the contact information of three references.
- Brief description of the PhD thesis.
To apply for a Postdoc in computational Electromagnetics for Soft X-ray Wafer Metrology, click here.
Application Deadline: December 31, 2021.
For more information on Postdoc in computational Electromagnetics for Soft X-ray Wafer Metrology, visit the official site.
